Valve World Expo and Conference 2016
Welcome to visit Metso in Hall 3, Stand F46, at Valve World Expo from November 29 to December 1, 2016 in Düsseldorf, Germany
At the exhibition we will be showcasing Metso's unique valve and service solution offering for the oil & gas, pulp & paper and other process industries.
The new Metso Neles NDX intelligent valve controller will be exhibited at the stand along with our overall valve offering.
Come and meet our experts to talk about services from a reliability point of view, as well as to get to know how to improve plant reliability and safety through maintenance planning.
Today, more people are interested in digitalization than ever. We are ready to discuss with you how we can use digitalization to boost efficiency. We also invite you to take a short VR ride – to go with the flow!
Two of our experts are presenting papers at the Valve World Conference:
- November 29 – Control valve session (Room 1, 11:00) ‘CFD in control valve cavitation modeling’, Tommi Bergström
- November 29 - Safety / SIS session (Room 1, 16;20) ‘Correct valve selection for ESD’, Ville Kähkönen
Metso's own mini-seminars
Join us also for our 20-minute mini-seminars held in a meeting room twice a day at 11am and 2 pm. As seats are limited, please reserve yours in advance by sending an e-mail to firstname.lastname@example.org.
The topics of the sessions are:
- 'Challenging erosion’ by Jussi Hellman Effective uptime and capacity are preconditions for a good return on investment in the process industry. This presentation focuses on advanced materials and wear protection concepts which offer significant durability and reliability improvements for flow control devices in erosive flow media.
- 'Valve monitoring to maximize reliability’ by George Buckbee Real-time data from the plant can give key insights into valve condition, and help minimize unplanned downtime. This presentation will show how Metso monitors and analyzes valve performance. You will learn how this targeted information can be leveraged to improve reliability.